A method for identifying scope and assumptions in developing and selecting methods and tools

This technical report describes a practical method consisting of a checklist and a supporting techniques for those planning or just starting to develop or select design tools and methods. The method helps to summarize and illustrate the envisaged tool or method by identifying its scope and the underlying assumptions. The resulting tool or method description clarifies the problem that is addressed, the approach and the possible implications, and can thus be used by a variety of people involved in assessing a tool or method in an early stage. For the developers themselves the method reveals how realistic the envisaged method or tool is, and whether the scope has to be narrowed.

Optimization on manifolds: Methods and applications

This paper provides an introduction to the topic of optimization on manifolds. The approach taken uses the language of differential geometry, however,we choose to emphasise the intuition of the concepts and the structures that are important in generating practical numerical algorithms rather than the technical details of the formulation. There are a number of algorithms that can be applied to solve such problems and we discuss the steepest descent and Newton's method in some detail as well as referencing the more important of the other approaches.There are a wide range of potential applications that we are aware of, and we briefly discuss these applications, as well as explaining one or two in more detail. © 2010 Springer -Verlag Berlin Heidelberg.

Atom probe tomography of SRAM transistors: Specimen preparation methods and analysis

Different FIB-based sample preparation methods for atom probe analysis of transistors have been proposed and discussed. A special procedure, involving device deprocessing, has been used to analyze by APT a sub-30 nm transistor extracted from a SRAM device. The analysis provides three dimensional compositions of Ni-silicide contact, metal gate and high-k oxide of the transistor gate. © 2013 Elsevier B.V. All rights reserved.